发明名称 charged particle beam system
摘要 An environmental cell for a charged particle beam system allows relative motion between the cell mounted on an X-Y stage and the optical axis of the focusing column, thereby eliminating the need for a sub-stage within the cell. A flexible cell configuration, such as a retractable lid, permits a variety of processes, including beam-induced and thermally-induced processes. Photon yield spectroscopy performed in a charged particle beam system and using gas cascade amplification of the photoelectrons allows analysis of material in the cell and monitoring of processing in the cell. Luminescence analysis can be also performed using a retractable mirror.
申请公布号 EP2450934(B1) 申请公布日期 2016.04.20
申请号 EP20110187990 申请日期 2011.11.07
申请人 FEI COMPANY 发明人 TOTH, MILOS;EMERSON, MARK;STRAW, MARCUS
分类号 H01J37/18;H01J37/20;H01J37/244;H01J37/305 主分类号 H01J37/18
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