发明名称 半導体装置の製造方法および半導体装置
摘要 The deposition rate of a porous insulation film is increased, and the film strength of the porous insulation film is improved. Two or more organic siloxane raw materials each having a cyclic SiO structure as a main skeleton thereof, and having mutually different structures, are vaporized, and transported with a carrier gas to a reactor (chamber), and an oxidant gas including an oxygen atom is added thereto. Thus, a porous insulation film is formed by a plasma CVD (Chemical Vapor Deposition) method or a plasma polymerization method in the reactor (chamber). In the step, the ratio of the flow rate of the added oxidant gas to the flow rate of the carrier gas is more than 0 and 0.08 or less.
申请公布号 JP5904866(B2) 申请公布日期 2016.04.20
申请号 JP20120106812 申请日期 2012.05.08
申请人 ルネサスエレクトロニクス株式会社 发明人 山本 博規;伊藤 文則;林 喜宏
分类号 H01L21/316;C23C16/42;H01L21/31;H01L21/768;H01L23/532 主分类号 H01L21/316
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