发明名称 フレキシブル半導体装置及びその製造方法
摘要 There is provided a method for manufacturing a flexible semiconductor device. The manufacturing method of the flexible semiconductor device of the present invention comprising the steps of: forming a gate electrode; forming a gate insulating film so that the gate insulating film contacts with the gate electrode; forming a semiconductor layer on the gate insulating film such that the semiconductor layer is opposed to the gate electrode; forming source and drain electrodes so that the source and drain electrodes contact with the semiconductor layer; forming a flexible film layer so that the flexible film layer covers the semiconductor layer and the source and drain electrodes; forming vias in the flexible film layer; forming a first metal layer by disposing a metal foil onto the flexible film layer, and thereby a semiconductor device precursor is provided; and subjecting the first metal layer to a processing treatment to form a wiring from a part of the first metal layer, wherein, in the step of the processing treatment of the first metal layer, the wiring is formed in a predetermined position by using at least one of the vias as an alignment marker.
申请公布号 JP5906396(B2) 申请公布日期 2016.04.20
申请号 JP20120538899 申请日期 2012.02.21
申请人 パナソニックIPマネジメント株式会社 发明人 鈴木 武;平野 浩一;増田 忍
分类号 H01L21/336;G03F9/00;H01L21/027;H01L21/768;H01L23/532;H01L29/786;H01L51/50;H05B33/02;H05B33/10;H05B33/12;H05B33/22 主分类号 H01L21/336
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