发明名称 TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE
摘要 A multiple degree of freedom sample stage or testing assembly including a multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes a plurality of stages including linear, and one or more of rotation or tilt stages configured to position a sample in a plurality of orientations for access or observation by multiple instruments in a clustered volume that confines movement of the multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes one or more clamping assemblies to statically hold the sample in place throughout observation and with the application of force to the sample, for instance by a mechanical testing instrument. Further, the multiple degree of freedom sample stage includes one or more cross roller bearing assemblies that substantially eliminate mechanical tolerance between elements of one or more stages in directions orthogonal to a moving axis of the respective stages.
申请公布号 EP2761357(A4) 申请公布日期 2016.04.20
申请号 EP20120835945 申请日期 2012.09.28
申请人 HYSITRON, INC. 发明人 CYRANKOWSKI, EDWARD;ASIF, SYED AMANULLA SYED;MAJOR, RYAN;RASUGU, DEREK;FENG, YUXIN
分类号 G02B21/26;G01N3/04;G01N3/42;G02B21/32;G21K5/08;G21K5/10;H01J37/20 主分类号 G02B21/26
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