发明名称 APPARATUS FOR CHEMICAL-MECHANICAL POLISHING OF WAFER
摘要 The present invention relates to a chemical mechanical polishing apparatus having a slurry supply unit supplying slurry. The slurry supply unit includes: a slurry guiding flow channel; an outflow port of the slurry guiding flow channel; a guiding flow channel block; a spray assisting gas pipe; a slurry washing water pipe; a slurry washing water spraying member; an assisting gas spraying member; and a slurry spraying member. According to the present invention, the chemical mechanical polishing apparatus can supply the slurry to an upper side of a polishing pad by a spray method while stably maintaining an opening state of a slurry spraying aperture.
申请公布号 KR101613462(B1) 申请公布日期 2016.04.19
申请号 KR20160018430 申请日期 2016.02.17
申请人 TSC INC. 发明人 KIM, OH SU;KWON, BYEONG HO;KIM, WOO SEUNG;KIM, HAN SUNG
分类号 H01L21/304;H01L21/02;H01L21/306;H01L21/461;H01L21/67 主分类号 H01L21/304
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