发明名称 |
APPARATUS FOR CHEMICAL-MECHANICAL POLISHING OF WAFER |
摘要 |
The present invention relates to a chemical mechanical polishing apparatus having a slurry supply unit supplying slurry. The slurry supply unit includes: a slurry guiding flow channel; an outflow port of the slurry guiding flow channel; a guiding flow channel block; a spray assisting gas pipe; a slurry washing water pipe; a slurry washing water spraying member; an assisting gas spraying member; and a slurry spraying member. According to the present invention, the chemical mechanical polishing apparatus can supply the slurry to an upper side of a polishing pad by a spray method while stably maintaining an opening state of a slurry spraying aperture. |
申请公布号 |
KR101613462(B1) |
申请公布日期 |
2016.04.19 |
申请号 |
KR20160018430 |
申请日期 |
2016.02.17 |
申请人 |
TSC INC. |
发明人 |
KIM, OH SU;KWON, BYEONG HO;KIM, WOO SEUNG;KIM, HAN SUNG |
分类号 |
H01L21/304;H01L21/02;H01L21/306;H01L21/461;H01L21/67 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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