发明名称 Apparatuses and methods for measuring an electrical characteristic of a model signal line and providing measurement information
摘要 Apparatuses and methods for measuring an electrical characteristic of a model signal line and providing measurement information based at least in part on the measurement of the electrical characteristic. An example apparatus includes a signal line model including a model signal line configured to model electrical characteristics of a signal line. The apparatus further includes a measurement circuit coupled to the signal line model and configured to measure the electrical characteristic of the model signal line responsive to an input signal provided to the model signal line. The measurement circuit is further configured to provide measurement information based at least in part on the measurement to set a signal applied to the signal line.
申请公布号 US9318173(B2) 申请公布日期 2016.04.19
申请号 US201313946841 申请日期 2013.07.19
申请人 Micron Technology, Inc. 发明人 Tanzawa Toru
分类号 G11C13/00;G11C7/22;G11C29/02;G11C7/10 主分类号 G11C13/00
代理机构 Dorsey & Whitney LLP 代理人 Dorsey & Whitney LLP
主权项 1. An apparatus, comprising: a signal line model including a model signal line configured to model electrical characteristics of a signal line; and a measurement circuit coupled to the signal line model, the measurement circuit configured to receive an input signal provided to the model signal line and receive an output signal of the model signal line, and configured to measure the electrical characteristic of the model signal line based on the input signal and the output signal, the measurement circuit further configured to provide measurement information based at least in part on a measurement to set a signal applied to the signal line, wherein the measurement circuit is configured to provide a pulse signal as the measurement information, wherein a pulse width of the pulse signal is representative of a propagation delay of the model signal line.
地址 Boise ID US