发明名称 System, methods and apparatus using virtual appliances in a semiconductor test environment
摘要 In one embodiment, a semiconductor test control system includes a computer system having a plurality of hardware resources; a hypervisor installed on the computer system; and a test floor controller installed on the computer system. The hypervisor virtualizes the hardware resources and provides each of at least one virtual appliance with access to a respective virtual set of the hardware resources. Each virtual set of the hardware resources places its respective virtual appliance in controlling communication with at least a first aspect of a semiconductor test system, thereby enabling the respective virtual appliance to test a respective type of semiconductor device. The test floor controller is in controlling communication with i) at least a second aspect of the semiconductor test system, and ii) each of the at least one virtual appliance.
申请公布号 US9317351(B2) 申请公布日期 2016.04.19
申请号 US201013821559 申请日期 2010.09.07
申请人 ADVANTEST CORPORATION 发明人 Hilliges Klaus-Dieter;Lin Jia-Wei;Gurley Duncan;Jin Jim-my;Vokerink Eric
分类号 G06F11/00;G06F11/07;G06F11/22;G06F11/30;G01R31/28;G01R31/319;G06F11/26;G06F9/455 主分类号 G06F11/00
代理机构 代理人
主权项 1. A method of controlling a semiconductor test system to test semiconductor devices, comprising: virtualizing a plurality of hardware resources of a computer system; installing at least two different virtual appliances on the computer system, the installation of each different virtual appliance providing the respective virtual appliance with access to a different respective virtual set of the hardware resources of the computer system, and each of the different virtual set of the hardware resources placing a respective one of the different virtual appliances in controlling communication with at least a first aspect of the semiconductor test system that relate to execution of a test program for a particular type of semiconductor device, thereby enabling the respective virtual appliance to test a respective type of semiconductor device; using a test floor controller installed on the computer system to control at least a second aspect of the semiconductor test system, wherein the second aspect of the semiconductor test system differs from the first aspect of the semiconductor test system; and using the test floor controller in controlling communication with each of the virtual appliances to operate each of the virtual appliances.
地址 Tokyo JP