| 摘要 |
In accordance with one embodiment, a method is provided for non-destructive examination of a composite structure having a non-conductive surface and a conductive substrate. The method may include applying an alternating current to a probe having a coil conductor, scanning the probe across the non-conductive surface to induce eddy currents in the conductive substrate, and measuring changes in an electrical property of the probe in response to changes in the eddy currents indicative of variations in the depth of the conductive substrate. |
