发明名称 Spin transfer torque cell for magnetic random access memory
摘要 Embodiments are directed to STT MRAM devices. One embodiment of an STT MRAM device includes a reference layer, a tunnel barrier layer, a free layer and one or more conductive vias. The reference layer is configured to have a fixed magnetic moment. In addition, the tunnel barrier layer is configured to enable electrons to tunnel between the reference layer and the free layer through the tunnel barrier layer. The free layer is disposed beneath the tunnel barrier layer and is configured to have an adaptable magnetic moment for the storage of data. The conductive via is disposed beneath the free layer and is connected to an electrode. Further, the conductive via has a width that is smaller than a width of the free layer such that a width of an active STT area for the storage of data in the free layer is defined by the width of the conductive via.
申请公布号 US9318698(B2) 申请公布日期 2016.04.19
申请号 US201514699716 申请日期 2015.04.29
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 Gaidis Michael C.;Nowak Janusz J.;Worledge Daniel C.
分类号 H01L21/00;H01L29/82;H01L43/12;H01L43/08;H01L43/02 主分类号 H01L21/00
代理机构 Tutunjian & Bitetto, P.C. 代理人 Tutunjian & Bitetto, P.C. ;Alexanian Vazken
主权项 1. A method for manufacturing spin transfer torque (STT) magnetic random access memory (MRAM) device comprising: forming at least one conductive via on at least one first electrode; depositing over the at least one conductive via a magnetic tunnel junction stack such that a free layer that is configured to have an adaptable magnetic moment for storage of data is disposed between the at least one conductive via and a tunnel barrier layer that is configured to enable electrons to tunnel between the free layer and a reference layer through the tunnel barrier layer; and depositing at least one second electrode over the magnetic tunnel junction stack to generate an MRAM device structure.
地址 Armonk NY US
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