| 摘要 |
A repair circuit of the present technology comprises: a fuse set latch array including a plurality of fuse set latches, and storing fuse information in a target fuse latch selected among the fuse set latches in response to a fuse latch selection signal; a fuse information control unit for generating the fuse latch selection signal by using a boot-up source signal generated by differently combining selection information on a boot-up mode area according to an area determination signal; and a repair process unit for accessing a normal memory cell or a redundant memory cell corresponding to an externally-input address by comparing the externally-input address with the fuse information. |
