发明名称 Semiconductor device with epitaxial structure
摘要 A semiconductor device includes a fin structure, an isolation structure, a gate structure and an epitaxial structure. The fin structure protrudes from the surface of the substrate and includes a top surface and two sidewalls. The isolation structure surrounds the fin structure. The gate structure overlays the top surface and the two sidewalls of a portion of the fin structure, and covers a portion of the isolation structure. The isolation structure under the gate structure has a first top surface, and the isolation structure at two sides of the gate structure has a second top surface. The first top surface is higher than the second top surface. The epitaxial layer is disposed at one side of the gate structure and is in direct contact with the fin structure.
申请公布号 US9318609(B2) 申请公布日期 2016.04.19
申请号 US201514620209 申请日期 2015.02.12
申请人 UNITED MICROELECTRONICS CORP. 发明人 Hung Yu-Hsiang;Fu Ssu-I;Chang Chung-Fu;Chen Cheng-Guo;Lin Chien-Ting
分类号 H01L27/01;H01L29/78;H01L29/66;H01L21/8234;H01L21/84;H01L27/12;H01L29/06;H01L29/161 主分类号 H01L27/01
代理机构 代理人 Hsu Winston;Margo Scott
主权项 1. A semiconductor device, comprising: a fin structure, protruding from a surface of a substrate, wherein the fin structure comprises a top surface and two side surfaces; an isolation structure, disposed on the surface of the substrate and surrounding the fin structure; a gate structure, overlaying the top surface and the two side surfaces of a portion of the fin structure and covering a portion of the isolation structure, wherein the isolation structure under the gate structure has a first top surface and the isolation structure at two sides of the gate structure has a second top surface, and the first top surface is higher than the second top surface; and an epitaxial layer, disposed at one side of the gate structure and in direct contact with the fin structure.
地址 Science-Based Industrial Park, Hsin-Chu TW