发明名称 |
Semiconductor device and method for manufacturing semiconductor device |
摘要 |
A semiconductor device according to one embodiment includes a semiconductor substrate, a back-gate layer formed above the semiconductor substrate, and a stacked body formed above the back-gate layer and comprising a plurality of insulating layers alternately formed between a plurality of electrode layers. The lowermost electrode layer of the plurality of electrode layers contains metal, and remaining electrode layers of the plurality of electrode layers other than the lowermost electrode layer do not contain the metal. Furthermore, the semiconductor device includes a pair of columnar semiconductor layers penetrating the stacked body and a semiconductor layer connecting lower portions of the pair of columnar semiconductor layers, the semiconductor layer embedded in the surface of the back-gate layer. |
申请公布号 |
US9318602(B2) |
申请公布日期 |
2016.04.19 |
申请号 |
US201313926307 |
申请日期 |
2013.06.25 |
申请人 |
Kabushiki Kaisha Toshiba |
发明人 |
Taniguchi Shuichi |
分类号 |
H01L29/788;H01L29/78;H01L21/28;H01L29/66;H01L29/792;H01L27/115 |
主分类号 |
H01L29/788 |
代理机构 |
Patterson & Sheridan, LLP |
代理人 |
Patterson & Sheridan, LLP |
主权项 |
1. A semiconductor device, comprising:
a semiconductor substrate; a back-gate layer formed above the semiconductor substrate; a stacked body formed above the back-gate layer, the stacked body including a plurality of insulating layers alternately formed between a plurality of electrode layers, wherein a lowermost electrode layer of the plurality of electrode layers contains a metal and remaining electrode layers of the plurality of electrode layers other than the lowermost electrode layer do not contain the metal of the lowermost electrode layer; a pair of columnar semiconductor layers penetrating the stacked body; and a semiconductor layer connecting lower portions of the pair of columnar semiconductor layers, the semiconductor layer embedded in a surface of the back-gate layer. |
地址 |
Tokyo JP |