发明名称 |
Semiconductor structure with low-melting-temperature conductive regions, and method of repairing a semiconductor structure |
摘要 |
A semiconductor structure includes at least a semiconductor body, a delimiting structure delimiting a cup-shaped recess in the body and a conductive region in the recess. The conductive region is made of a low-melting-temperature material, having a melting temperature lower than that of the materials forming the delimiting structure. |
申请公布号 |
US9318313(B2) |
申请公布日期 |
2016.04.19 |
申请号 |
US201313869124 |
申请日期 |
2013.04.24 |
申请人 |
STMicroelectronics S.r.l. |
发明人 |
Pagani Alberto;Ziglioli Federico Giovanni |
分类号 |
H01L29/40;H01L21/00;H01L21/02;H01L21/66;H01L23/00;H01L25/065;H01L23/544 |
主分类号 |
H01L29/40 |
代理机构 |
Gardere Wynne Sewell LLP |
代理人 |
Gardere Wynne Sewell LLP |
主权项 |
1. A structure, comprising: a semiconductor first layer configured to be solid at a temperature; a region disposed adjacent to the semiconductor first layer and configured to be solid at the temperature; an exposed recess disposed in the region; and a coupling pad having a heating element, the coupling pad disposed in the exposed recess and including a first conductive portion configured to be molten at the temperature. |
地址 |
Agrate Brianza IT |