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发明名称
发光装置之光量校正方法、测试设备与列印设备
摘要
发光装置之光量校正方法与测试设备与列印设备。光量校正方法除了校正发光元件的输出光量之外,还将发光元件的光轮廓特性一并考量来进行校正。首先,量测发光元件之光量及光轮廓参数。再针对每一发光元件,根据对应之光量及对应之光轮廓参数产生一光量校正值。续而针对每一发光元件,根据对应之光量校正值调整其光量。藉此,可精准地控制每一发光元件的输出光量,使得列印品质达到一致。
申请公布号
TW201614399
申请公布日期
2016.04.16
申请号
TW103135748
申请日期
2014.10.15
申请人
日昌电子股份有限公司
发明人
岩森俊道;吴俊毅
分类号
G03G15/043(2006.01)
主分类号
G03G15/043(2006.01)
代理机构
代理人
李文贤
主权项
一种发光装置之光量校正方法,该发光装置包含复数发光元件,该发光装置之光量校正方法包含: 量测该复数发光元件之一光量及一光轮廓参数; 针对每一该发光元件,根据对应之该光量及对应之该光轮廓参数产生一光量校正值;及 针对每一该发光元件,根据对应之该光量校正值调整该光量。
地址
新北市新店区宝桥路235巷132号6楼
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