发明名称 RECESSED TRANSISTORS CONTAINING FERROELECTRIC MATERIAL
摘要 Some embodiments include transistor constructions having a first insulative structure lining a recess within a base. A first conductive structure lines an interior of the first insulative structure, and a ferroelectric structure lines an interior of the first conductive structure. A second conductive structure is within a lower region of the ferroelectric structure, and the second conductive structure has an uppermost surface beneath an uppermost surface of the first conductive structure. A second insulative structure is over the second conductive structure and within the ferroelectric structure. A pair of source/drain regions are adjacent an upper region of the first insulative structure and are on opposing sides of the first insulative structure from one another.
申请公布号 WO2016057097(A1) 申请公布日期 2016.04.14
申请号 WO2015US39480 申请日期 2015.07.08
申请人 MICRON TECHNOLOGY, INC. 发明人 RAMASWAMY, DURAL, VISHAK NIRMAL
分类号 H01L27/115;H01L21/8247;H01L29/78 主分类号 H01L27/115
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