发明名称 |
METHOD FOR MANUFACTURING THIN-FILM TRANSISTOR |
摘要 |
A method for manufacturing a thin-film transistor (1) having an oxide semiconductor layer (40), the method including: a step (S30) for introducing a prescribed process gas and performing sputtering, thereby forming an oxide semiconductor film (40a) such that the carrier density exceeds a prescribed first value; and a step (S40) for performing an annealing treatment or a plasma treatment in an oxidizing atmosphere such that the carrier density of the oxide semiconductor film (40a) is at or below the first value. |
申请公布号 |
WO2016056206(A1) |
申请公布日期 |
2016.04.14 |
申请号 |
WO2015JP04989 |
申请日期 |
2015.09.30 |
申请人 |
JOLED INC. |
发明人 |
SASAKI, ATSUSHI;TAKEDA, EIJI;GOTO, MASASHI;SUGAWARA, YUTA |
分类号 |
H01L29/786;C23C14/08;C23C14/58;H01L21/336;H01L21/363 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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