| 发明名称 |
Method And Apparatus Of Latency Profiling Mechanism |
| 摘要 |
Techniques related to a latency profiling mechanism are described. A method may monitor at least one attribute associated with each of one or more frames of images by tracking a respective identifier of each of the one or more frames as each of the one or more frames is processed through a first pipeline of one or more processing stages of an image processing device. The method may also obtain one or more indications related to one or more performance indices in the first pipeline of one or more processing stages based at least in part on the monitoring of the at least one attribute. |
| 申请公布号 |
US2016104263(A1) |
申请公布日期 |
2016.04.14 |
| 申请号 |
US201514806656 |
申请日期 |
2015.07.23 |
| 申请人 |
Media Tek Inc. |
发明人 |
Chen Yi-Cheng;Lin, I Yi Hsuan;Liu Kun-Hao |
| 分类号 |
G06T1/20 |
主分类号 |
G06T1/20 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method, comprising:
monitoring at least one attribute associated with each of one or more frames of images by tracking a respective identifier of each of the one or more frames as each of the one or more frames is processed through a first pipeline of one or more processing stages of an image processing device; and obtaining one or more indications related to one or more performance indices in the first pipeline of one or more processing stages based at least in part on the monitoring of the at least one attribute. |
| 地址 |
Hsinchu TW |
