发明名称 |
TEST ARRANGEMENT AND METHOD FOR TESTING A SWITCHING SYSTEM |
摘要 |
In order to be able to test switching systems of different manufacturers and types in a simple manner, a control unit (6) for a switching device (5) of the switching system (4) is connected to a test device (10) via an adapter cable (11), said test device emulating the switching device (5). The test device (10) reads out configuration-specific data from a memory unit (15) on the adapter cable (11) and the test device (10) uses said data to configure its signal inputs (BE) and signal outputs (BA, AA) required for carrying out the test. |
申请公布号 |
WO2016055307(A1) |
申请公布日期 |
2016.04.14 |
申请号 |
WO2015EP72438 |
申请日期 |
2015.09.29 |
申请人 |
OMICRON ELECTRONICS GMBH |
发明人 |
JOCHUM, MICHAEL;GEIGER, STEPHAN;KÜNG, RAINER |
分类号 |
G01R31/327;G01R19/25 |
主分类号 |
G01R31/327 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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