| 摘要 |
The device for measuring a radiation pattern of a radiative source (103) of maximum linear size a emitting radiation in a frequency range Fi corresponding to a wavelength range λi comprises parallel reflective plates (101, 102) oriented along a longitudinal axis Y, between which plates is placed centrally the radiative source (103). The distance d between the radiative source (103) and each of the plates (101, 102) is larger than or equal to each of the wavelengths λ. At least one probe (104) that is sensitive to the far-field amplitude and phase of the radiation of the radiative source (103) is also placed between the plates (101, 102) at a distance DR from the radiative source (103), the probe furthermore being shifted from the radiative source along a transverse axis X perpendicular to the longitudinal axis Y by a value e larger than or equal to Ai/10. The distance DR is larger than or equal to 2a2λi. A device (105, 106) is provided to move the probe (104) stepwise in the transverse direction X. The probe (104) is connected to a vector network analyser (111). A processing unit (110) receives data from the vector network analyser (111), controls the device (105, 106) to move the probe (104) stepwise and acquires, on each step, data from the vector network analyser (111) for a plurality of frequencies Fi separated by a frequency step size of ΔF. |
