| 摘要 |
The present invention relates to a test device for testing an electrical property of an object having a plurality of slope surface contacts. The test device comprises: an object carrier which has an object accommodating part of accommodating the object to a test; and a contact support part which supports a plurality of contacts having a head exposed in the object accommodating part to touch the slope surface contacts while the object accommodates in the object accommodating part. According to the present invention, a test probe can accurately touch the slope surface contacts of the object. Thereby, the reliability of the test can be improved. |
