| 发明名称 |
REPAIR CIRCUIT AND SEMICONDUCTOR MEMORY DEVICE INCLUDING THE SAME |
| 摘要 |
A repair circuit includes a normal decoder suitable for decoding partial input addresses of input addresses in response to a first control signal, a comparison unit suitable for comparing the partial input addresses and partial repair addresses of repair addresses in response to a second control signal, and generating a column repair signal when the partial input addresses and the partial repair addresses correspond to each other, and a redundancy decoder suitable for decoding the repair addresses in response to the column repair signal. |
| 申请公布号 |
US2016104546(A1) |
申请公布日期 |
2016.04.14 |
| 申请号 |
US201514627875 |
申请日期 |
2015.02.20 |
| 申请人 |
SK hynix Inc. |
发明人 |
YUN Tae-Sik |
| 分类号 |
G11C29/00;G11C29/04;G11C8/10 |
主分类号 |
G11C29/00 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A repair circuit comprising:
a normal decoder suitable for decoding partial input addresses of input addresses in response to a first control signal; a comparison unit suitable for comparing the partial input addresses and partial repair addresses of repair addresses in response to a second control signal, and generating a column repair signal if the partial input addresses and the partial repair addresses correspond to each other; and a redundancy decoder suitable for decoding the repair addresses in response to the column repair signal. |
| 地址 |
Gyeonggi-do KR |
