| 主权项 |
1. An apparatus to indicate an amplitude of an uneven measurement surface, the apparatus comprising,
a frame slidingly supporting a set of pins, each pin individually spring biased to engage the uneven measurement surface, each pin including a high point stop and a low point stop fixedly coupled thereto; a low point isolator member moveable relative to the frame, the low point isolator member indicating a lowest point of the uneven measurement surface engaged by the set of pins based on engagement of the low point isolator member by a respective low point stop of a first pin in the set of pins that engages a low point of the uneven measurement surface; a high point isolator member moveable relative to the frame, the high point isolator member indicating a highest point of the uneven measurement surface engaged by the set of pins based on engagement of the high point isolator member by a respective high point stop of a second pin in the set of pins that engages a high point of the uneven measurement surface; a low point displacement sensor fixedly coupled to the frame, and having a first sensor tip engaging the low point isolator member for identifying a low point displacement; a high point displacement sensor fixedly coupled to the frame, and having a second sensor tip engaging the high point isolator member for identifying a high point displacement; and a calculator for calculating a difference between the low point displacement and the high point displacement, the difference indicative of the amplitude of the uneven measurement surface. |
