发明名称 METHOD AND APPARATUS FOR DIAGNOSING STATUS OF PARTS IN REAL TIME IN PLASMA PROCESSING EQUIPMENT
摘要 Apparatus and methods for diagnosing status of a consumable part of a plasma reaction chamber, the consumable part including at least one conductive element embedded therein. The method includes the steps of: coupling the conductive element to a power supply so that a bias potential relative to the ground is applied to the conductive element; exposing the consumable part to plasma erosion until the conductive element draws a current from the plasma upon exposure of the conductive element to the plasma; measuring the current; and evaluating a degree of erosion of the consumable part due to the plasma based on the measured current.
申请公布号 US2016103088(A1) 申请公布日期 2016.04.14
申请号 US201514969614 申请日期 2015.12.15
申请人 Lam Research Corporation 发明人 PATRICK Roger
分类号 G01N27/20;C23C16/50;G01N17/04 主分类号 G01N27/20
代理机构 代理人
主权项 1. A consumable part of a plasma reaction chamber, the consumable part is formed of conductive material and including a surface to be exposed to plasma, includes: conductive elements embedded in the consumable part and electrically insulated from the consumable part by a dielectric layer; a probe circuit coupled to the conductive elements; and a power supply coupled to the probe circuit and ground to apply a bias potential to the conductive elements relative to the ground, wherein the conductive elements are operative to draw a current from the plasma upon exposure of the conductive elements to the plasma and the probe circuit is operative to measure the current.
地址 Fremont CA US