发明名称 |
METHOD AND APPARATUS FOR DIAGNOSING STATUS OF PARTS IN REAL TIME IN PLASMA PROCESSING EQUIPMENT |
摘要 |
Apparatus and methods for diagnosing status of a consumable part of a plasma reaction chamber, the consumable part including at least one conductive element embedded therein. The method includes the steps of: coupling the conductive element to a power supply so that a bias potential relative to the ground is applied to the conductive element; exposing the consumable part to plasma erosion until the conductive element draws a current from the plasma upon exposure of the conductive element to the plasma; measuring the current; and evaluating a degree of erosion of the consumable part due to the plasma based on the measured current. |
申请公布号 |
US2016103088(A1) |
申请公布日期 |
2016.04.14 |
申请号 |
US201514969614 |
申请日期 |
2015.12.15 |
申请人 |
Lam Research Corporation |
发明人 |
PATRICK Roger |
分类号 |
G01N27/20;C23C16/50;G01N17/04 |
主分类号 |
G01N27/20 |
代理机构 |
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代理人 |
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主权项 |
1. A consumable part of a plasma reaction chamber, the consumable part is formed of conductive material and including a surface to be exposed to plasma, includes:
conductive elements embedded in the consumable part and electrically insulated from the consumable part by a dielectric layer; a probe circuit coupled to the conductive elements; and a power supply coupled to the probe circuit and ground to apply a bias potential to the conductive elements relative to the ground, wherein the conductive elements are operative to draw a current from the plasma upon exposure of the conductive elements to the plasma and the probe circuit is operative to measure the current. |
地址 |
Fremont CA US |