发明名称 MICROSCOPE SYSTEM
摘要 A microscope system according to the present invention includes a laser light source, a plurality of laser microscopes, and an optical path switching unit that is provided between the laser light source and the laser microscopes and switches a supply destination of a laser beam among the plurality of laser microscopes by changing a beam splitter to be arranged on an incident optical axis, in which each of the laser microscopes includes an optical axis adjustment unit that adjusts an optical axis of the laser beam, and a control unit that controls the optical axis adjustment unit based on identification information about the beam splitter arranged on the incident optical axis.
申请公布号 US2016103309(A1) 申请公布日期 2016.04.14
申请号 US201514874009 申请日期 2015.10.02
申请人 OLYMPUS CORPORATION 发明人 SUZUKI Shingo;KIMURA Takuma;UENO Makio
分类号 G02B21/06;G02B27/14 主分类号 G02B21/06
代理机构 代理人
主权项 1. A microscope system comprising: a laser light source that outputs a laser beam; a plurality of laser microscopes; and an optical path switching unit that is provided between the laser light source and the plurality of laser microscopes and switches an optical path of the laser beam output from the laser light source among a plurality of optical paths respectively directed toward the plurality of laser microscopes, wherein the optical path switching unit includes a plurality of beam splitters that respectively distribute the incident laser beam among the plurality of optical paths in different distribution ratios, and can switch the laser microscope to which the laser beam is supplied by changing the beam splitter to be arranged on the incident optical axis of the laser beam from the laser light source, and each of the plurality of laser microscopes includes an optical axis adjustment unit that adjusts the optical axis of the laser beam supplied from the optical path switching unit, anda control unit that acquires identification information about the beam splitter arranged on the incident optical axis from the optical path switching unit and controls the optical axis adjustment unit based on the acquired identification information.
地址 Tokyo JP