发明名称 Ultra-small angle X-ray scattering measuring apparatus
摘要 An ultra-small angle X-ray scattering measuring apparatus includes a detector for detecting X-rays emitted from a sample, an x-ray collimating mirror arranged between the X-ray real focus and the sample, a monochromator arranged between the X-ray collimating mirror and the sample and an analyzer arranged between the sample and the detector. The X-ray collimating mirror includes a pair of X-ray mirrors that are arranged orthogonally relative to each other. The X-ray mirrors are multilayer film mirrors and their X-ray reflection surfaces are paraboloidal. The interplanar spacing of lattice planes of each of the multilayer films is continuously changed along the paraboloid so as to meet the Bragg's condition. The monochromator and the analyzer are formed by using a channel-cut crystal. The analyzer is driven to rotate for scanning around a 2¸-axial line and diffracted rays reduced to a spectrum by the analyzer are detected by the detector.
申请公布号 EP1876440(B1) 申请公布日期 2016.04.13
申请号 EP20070252692 申请日期 2007.07.05
申请人 RIGAKU CORPORATION 发明人 IWASAKI, YOSHIO;YOKOZAWA, YUTAKA
分类号 G01N23/201;G21K1/06 主分类号 G01N23/201
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