| 摘要 |
A system for analysing data from a microwave inverse scattering imaging apparatus, said system comprising a processor which is configured to: process data derived from radiation scattered by an object under test by performing a reconstruction process, said reconstruction process being configured to reconstruct the material properties of the object under test by constructing a numerical mode! to fit said data and updating said numerical model in an iterative manner, the processor being further configured to process data concerning information about a feature of interest within the object under test and adapt the reconstruction process by weighting data derived from the scattered radiation on the basis of said information, wherein the weighting selected for a current iteration of the reconstruction process is dependent on the outcome of an earlier iteration. |
