发明名称 解析プログラム、解析方法、および解析装置
摘要 <P>PROBLEM TO BE SOLVED: To provide a function with a reduced calculation amount required for leakage current analysis of an entire analyzed circuit. <P>SOLUTION: A variation function L1 is represented by: an average value for each cell included in an analyzed circuit 100, which is obtained from a normal distribution represented by a constant a, a first weight coefficient b, and a first probability variable &alpha; that shows variations in leakage current specific to the cell; and a result therefor which is obtained by multiplying a second probability variable &beta; that shows variations in leakage current common in cell groups in the analyzed circuit 100 by a second weight coefficient c. In the variation function L1, non-existence of the first probability variable &alpha; reduces a calculation amount for generating a value of the first probability variable &alpha; with a random number predetermined times. An analyzer provides the variation function L1 with a value of the constant a, a value of the first weight coefficient b, and a value of the second weight coefficient c that are acquired for each cell, and thereby generates the variation function of a leakage current quantity of the analyzed circuit 100 which varies according to a value of the second probability variable &beta;. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP5903830(B2) 申请公布日期 2016.04.13
申请号 JP20110234395 申请日期 2011.10.25
申请人 富士通株式会社 发明人 本間 克己
分类号 G06F17/50 主分类号 G06F17/50
代理机构 代理人
主权项
地址