ABSOLUTE PHASE MEASUREMENT WITH SECONDARY PATTERN-EMBEDDED FRINGE

摘要

Multiple images of a scene are captured while a phase-shifted fringe embedded with a secondary pattern is projected onto the scene. A wrapped phase map is generated based on the captured images, and a continuous region mask is determined to segment the wrapped phase map into multiple continuous regions. A period disparity of the fringe is determined for each region based at least in part on the embedded secondary pattern, and the regional period disparities are applied to a spatially unwrapped phase map to produce an absolute phase map and finally a depth map.