发明名称 Ferroelectric memory cell and methods for manufacture thereof
摘要 The present invention is related to the realization of a simplified bottom electrode stack for high-density ferroelectric memory cells, where the ferroelectric capacitor is positioned directly on top of the contact plug. The ferroelectric layer is formed a low partial oxygen pressure to maintain the bottom electrode in its metallic form.
申请公布号 EP1331661(B1) 申请公布日期 2016.04.13
申请号 EP20020447217 申请日期 2002.11.12
申请人 IMEC;STMICROELECTRONICS N.V. 发明人 WOUTERS, DIRK;EVERAERT, JEAN-LUC;LISONI, JUDIT
分类号 H01L49/02;H01L21/02;H01L21/314;H01L21/316 主分类号 H01L49/02
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