| 摘要 |
[Problem] To provide a fluorescence detection method which makes it possible to accurately compare measurement results between sensor structures by correcting the amount of fluorescence of a substance to be measured in consideration of electric field intensity that differs between the sensor structures. [Solution] A fluorescence detection method in which using a sensor structure configured from at least a dielectric member, a metallic thin film formed on the upper surface of the dielectric member, and a reaction layer formed on the upper surface of the metallic thin film, excitation light is applied at an incident angle that becomes a total reflection condition from the dielectric member side to enhance an electric filed on the metallic thin film, a fluorescent substance with which an analyte captured by the reaction layer is labeled is excited by the enhanced electric filed, and the amount of fluorescence from the excited fluorescent substance is measured by a light detection means. On the basis of a first scattered light amount measured when the excitation light is applied on a first measurement condition, and a second scattered light amount measured when the excitation light is applied on a second measurement condition different from the first measurement condition, the amount of fluorescence measured by applying the excitation light on the first measurement condition is corrected. |
