发明名称 Super-resolution microscope
摘要 A super-resolution microscope comprises: an illumination optical system that condenses a first illumination light beam for exciting the molecule from a stable state to a first quantum state and a second illumination light beam for further transitioning the molecule onto a sample in a manner that the first and the second illumination light beams are partially overlapped; a scanning section that scans the sample by relatively displacing the first and the second illumination light beams and the sample; a detection section that detects an optical response signal emitted from the sample; and a phase plate that is arranged in the illumination optical system and has M surface areas for modulating the phase of the second illumination light beam, wherein the phase plate comprises a monolayer optical thin film with M surface areas formed on an optical substrate with a thickness that satisfies the predetermined conditional expression.
申请公布号 US9310595(B2) 申请公布日期 2016.04.12
申请号 US201313847598 申请日期 2013.03.20
申请人 OLYMPUS CORPORATION 发明人 Iketaki Yoshinori;Bokor Nandor
分类号 G02B21/00;G02B5/30 主分类号 G02B21/00
代理机构 Scully, Scott, Murphy & Presser, P.C. 代理人 Scully, Scott, Murphy & Presser, P.C.
主权项 1. A super-resolution microscope for observing a sample containing a molecule having at least two or more excited quantum state comprising: an illumination optical system that condenses a first illumination light beam for exciting the molecule from a stable state to a first quantum state and a second illumination light beam for further transitioning the molecule to another quantum state onto a sample in a manner that the first illumination light beam and the second illumination light beam are partially overlapped with each other so as to irradiate the sample with the first illumination light beam and the second illumination light beam; a scanning section that scans the sample by relatively displacing the first illumination light beam and the second illumination light beam and the sample; a detection section that detects an optical response signal emitted from the sample in response to irradiation of the first illumination light beam and the second illumination light beam; and a phase plate that is arranged in an optical path of the illumination optical system through which the first illumination light beam and the second illumination light beam pass and has a plurality M of surface areas for modulating the phase of at least a portion of the second illumination light beam, wherein the phase plate comprises a monolayer optical thin film with the plurality M of surface areas formed on an optical substrate in a thickness that satisfies the following conditional expression:2⁢⁢πλe⁢(ne-1)·di=2⁢⁢ⅈ⁢⁢πM+2⁢⁢mi⁢π2⁢⁢πλp⁢(np-1)·di=Ψi+2⁢li⁢⁢πΨi≤π4 where di is the thickness of the optical thin film formed on the ith surface area, λp is the first illumination light beam wavelength, λe is the second illumination light beam wavelength, np is the refractive index of the first illumination light beam in the optical thin film, ne is the refractive index of the second illumination light beam in the optical thin film, mi and li are integers characterizing the thickness of the optical thin film formed on the jth surface area, and Ψ represents a constant phase shift.
地址 Tokyo JP