发明名称 Memory sense amplifiers and memory verification methods
摘要 Memory sense amplifiers and memory verification methods are described. According to one aspect, a memory sense amplifier includes a first input coupled with a memory element of a memory cell, wherein the memory element has different memory states at different moments in time, a second input configured to receive a reference signal, modification circuitry configured to provide a data signal at the first input from the memory element having a plurality of different voltages corresponding to respective ones of different memory states of the memory cell at the different moments in time, and comparison circuitry coupled with the modification circuitry and configured to compare the data signal and the reference signal at the different moments in time and to provide an output signal indicative of the memory state of the memory cell at the different moments in time as a result of the comparison to implement a plurality of verify operations of the memory states of the memory cell at the different moments in time.
申请公布号 US9311999(B2) 申请公布日期 2016.04.12
申请号 US201414478894 申请日期 2014.09.05
申请人 Micron Technology, Inc. 发明人 Kitagawa Makoto;Tedrow Kerry
分类号 G11C7/14;G11C13/00;G11C7/06;G11C11/56 主分类号 G11C7/14
代理机构 Wells St. John P.S. 代理人 Wells St. John P.S.
主权项 1. A memory sense amplifier comprising: a first input coupled with a memory element of a memory cell, wherein the memory element has different memory states at different moments in time; a second input configured to receive a reference signal; modification circuitry configured to provide a data signal at the first input from the memory element having a plurality of different voltages corresponding to respective ones of the different memory states of the memory element at the different moments in time, wherein the modification circuitry comprises a plurality of transistors individually coupled with one of the first and the second inputs; supply circuitry configured to provide different bias signals to the transistors, the different bias signals corresponding to the different memory states of the memory element to be verified at the different moments in time; and comparison circuitry coupled with the modification circuitry and configured to compare the data signal and the reference signal at the different moments in time and to provide an output signal indicative of the memory states of the memory element at the different moments in time as a result of the comparison to implement a plurality of verify operations of the memory states of the memory element at the different moments in time.
地址 Boise ID US