发明名称 Semiconductor storage device having resistance-change storage elements
摘要 A semiconductor storage device according to an embodiment includes a plurality of resistance-change storage elements. A plurality of bit lines are connected to the storage elements, respectively. A voltage control circuit controls a decreasing rate of an absolute value of a voltage of a selected bit line among the bit lines when data is written to one of the storage elements.
申请公布号 US9311996(B2) 申请公布日期 2016.04.12
申请号 US201514624995 申请日期 2015.02.18
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 Ogiwara Ryu;Takashima Daisaburo
分类号 G11C11/00;G11C13/00 主分类号 G11C11/00
代理机构 Oblon, McClelland, Maier & Neustadt, L.L.P. 代理人 Oblon, McClelland, Maier & Neustadt, L.L.P.
主权项 1. A semiconductor storage device comprising: a plurality of resistance-change storage elements; a plurality of bit lines connected to the storage elements, respectively; and a voltage control circuit controlling a decreasing rate of an absolute value of a voltage of a selected bit line among the bit lines when data is written to one of the storage elements, wherein the voltage control circuit comprises: a plurality of current supply paths supplying a current to the selected bit line when data is written to one of the storage elements; and a plurality of current control switches between the current supply paths corresponding thereto, respectively, and the selected bit line, wherein the current supply paths are disconnected from the selected bit line by the current control switches, respectively, in time series when an absolute value of a voltage of the selected bit line is to be decreased after being increased in a data write operation.
地址 Minato-ku JP