Adaptive test sequence for testing integrated circuits

摘要

A method includes testing a first device and a second device identical to each other and comprising integrated circuits. The testing of the first device is performed according to a first test sequence of the first device, wherein the first test sequence includes a plurality of ordered test items, and wherein the first test sequence includes a test item. A test priority of the test item is calculated based on a frequency of fails of the test item in the testing of a plurality of devices having an identical structure as the first device. The first test sequence is then adjusted to generate a second test sequence in response to the test priority of the test item, wherein the second test sequence is different from the first test sequence. The second device is tested according to the second test sequence.

主权项

1. A method comprising:
testing a first device comprising integrated circuits according to a first test sequence of the first device, wherein the first test sequence comprises a plurality of ordered test items, and wherein the first test sequence comprises a first test item; calculating a test priority of the first test item based on a frequency of fails of the first test item in the testing of a plurality of devices having an identical structure as the first device, wherein the calculating the test priority of the first test item comprises:
assigning a first weight to the first test item;multiplying the first weight by a total count of failed ones of the plurality of devices that failed in the first test item to obtain a product; anddividing the product by a total count of the plurality of devices; adjusting the first test sequence to generate a second test sequence in response to the test priority of the first test item, wherein the second test sequence is different from the first test sequence; and testing a second device identical to the first device according to the second test sequence.