发明名称 Automatic analyzer and analysis method
摘要 In known automatic analyzers for detecting an abnormality by approximating reaction process data using a function, accuracy of detecting a reaction abnormality is degraded because of poor approximation accuracy depending on test items. Data processing means stores the absorbance and time of day at which the absorbance is measured as time-series data. Letting x denote absorbance, t denote time, and * denote a symbol representing multiplication, we have a function x=a0+a1*exp(−k1*t)+a2*exp(−k2*t). Values of parameters a0, a1, a2, ai, k1, and k2 are calculated so that a difference between the absorbance at the measured time calculated using the above expression and the time-series data is minimal, and presence of an abnormality is determined based on the parameter values.
申请公布号 US9310388(B2) 申请公布日期 2016.04.12
申请号 US201013318535 申请日期 2010.04.12
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 Kamihara Kumiko;Mitsuyama Satoshi;Mimura Tomonori;Manri Chihiro
分类号 G01C19/00;G01N35/00;G01N21/27 主分类号 G01C19/00
代理机构 Mattingly & Malur, PC 代理人 Mattingly & Malur, PC
主权项 1. An automatic analyzer comprising: a sample disk holding a plurality of sample vessels; a reaction disk holding a plurality of reaction vessels; a reagent disk; a storage mechanism for storing approximate expressions for changes in measured values with time, each of the approximate expressions being associated with a corresponding test item or specimen; a multiwavelength photometer configured to detect absorbance data of a reaction in a reaction vessel of the plurality of reaction vessels, the absorbance data stored as a plurality of measured values for one of the test items or specimens at a plurality of measurement points in time; a parameter optimizing mechanism for calculating parameter values of one of the approximate expressions associated with the one of the test items or specimens stored in the storage mechanism based on the measured values; and a determining mechanism for determining whether an abnormality is present in the measured values based on the parameter values optimized by the parameter optimizing mechanism, wherein the one of the approximate expressions is: x=a0+a1*exp(−k1*t)+a2*exp(−k2*t), where t denotes a measurement point in time, x denotes a calculated value, and * denotes multiplication, parameter values a0, a1, a2, k1 and k2 in the one of the approximate expressions are optimized so that a difference between the measured values and the calculated values obtained with the one of the approximate expressions at the measurement points in time are minimized, and the determining mechanism determines the presence of the abnormality in the measured values when the parameter values fall outside a predetermined range, and issues a notification of the presence of the abnormality in the measured values for the one of the test items or specimens.
地址 Tokyo JP