发明名称 |
System and method of electromigration avoidance for automatic place-and-route |
摘要 |
A method includes identifying at least one local power segment of a circuit, estimating at least one performance parameter of the at least one power segment based on a computer-based simulation of the circuit, and changing a design of the circuit based on at least one electromigration avoidance strategy if the at least one parameter is greater than or equal to a threshold value. A data file representing the circuit is stored if the at least one parameter is less than the threshold value. |
申请公布号 |
US9311440(B2) |
申请公布日期 |
2016.04.12 |
申请号 |
US201213468055 |
申请日期 |
2012.05.10 |
申请人 |
Taiwan Semiconductor Manufacturing Co., Ltd. |
发明人 |
Kao Jerry;Tam King-Ho;Lee Meng-Xiang;Hsu Li-Chung;Yu Chi-Yeh;Fu Chung-Min;Wang Chung-Hsing |
分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
Duane Morris LLP |
代理人 |
Duane Morris LLP |
主权项 |
1. A method, comprising:
identifying at least one local power segment of a circuit; dividing an area occupied by devices supplied by the at least one local power segment into a plurality of cells, wherein each cell has a respective power consumption and a respective area that is based on the respective power consumption such that the power consumptions of each of the plurality of cells are approximately equal; estimating at least one performance parameter of the at least one local power segment based on a computer-based simulation of the circuit; making a design change in the circuit based on at least one electromigration avoidance strategy if the at least one parameter is greater than or equal to a threshold value, wherein the design change affects at least one cell of the plurality of cells; and storing a data file representing the circuit if the at least one parameter is less than the threshold value. |
地址 |
Hsin-Chu TW |