发明名称 System and method of electromigration avoidance for automatic place-and-route
摘要 A method includes identifying at least one local power segment of a circuit, estimating at least one performance parameter of the at least one power segment based on a computer-based simulation of the circuit, and changing a design of the circuit based on at least one electromigration avoidance strategy if the at least one parameter is greater than or equal to a threshold value. A data file representing the circuit is stored if the at least one parameter is less than the threshold value.
申请公布号 US9311440(B2) 申请公布日期 2016.04.12
申请号 US201213468055 申请日期 2012.05.10
申请人 Taiwan Semiconductor Manufacturing Co., Ltd. 发明人 Kao Jerry;Tam King-Ho;Lee Meng-Xiang;Hsu Li-Chung;Yu Chi-Yeh;Fu Chung-Min;Wang Chung-Hsing
分类号 G06F17/50 主分类号 G06F17/50
代理机构 Duane Morris LLP 代理人 Duane Morris LLP
主权项 1. A method, comprising: identifying at least one local power segment of a circuit; dividing an area occupied by devices supplied by the at least one local power segment into a plurality of cells, wherein each cell has a respective power consumption and a respective area that is based on the respective power consumption such that the power consumptions of each of the plurality of cells are approximately equal; estimating at least one performance parameter of the at least one local power segment based on a computer-based simulation of the circuit; making a design change in the circuit based on at least one electromigration avoidance strategy if the at least one parameter is greater than or equal to a threshold value, wherein the design change affects at least one cell of the plurality of cells; and storing a data file representing the circuit if the at least one parameter is less than the threshold value.
地址 Hsin-Chu TW