发明名称 Conductive pillar structure for semiconductor substrate and method of manufacture
摘要 A conductive pillar structure for a die includes a passivation layer having a metal contact opening over a substrate. A bond pad has a first portion inside the metal contact opening and a second portion overlying the passivation layer. The second portion of the bond pad has a first width. A buffer layer over the bond pad has a pillar contact opening with a second width to expose a portion of the bond pad. A conductive pillar has a first portion inside the pillar contact opening and a second portion over the buffer layer. The second portion of the conductive pillar has a third width. A ratio of the second width to the first width is between about 0.35 and about 0.65. A ratio of the second width to the third width is between about 0.35 and about 0.65.
申请公布号 US9312230(B2) 申请公布日期 2016.04.12
申请号 US201012701868 申请日期 2010.02.08
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 Chen Chih-Hua;Chen Chen-Shien;Kuo Chen-Cheng
分类号 H01L23/00;H01L23/31 主分类号 H01L23/00
代理机构 Hauptman Ham, LLP 代理人 Hauptman Ham, LLP
主权项 1. A semiconductor die comprising: a substrate; a passivation layer having a metal contact opening over the substrate; a bond pad having a first portion inside the metal contact opening and a second portion overlying the passivation layer, the second portion of the bond pad having a first width; a buffer layer disposed over the bond pad, the buffer layer having a pillar contact opening with a second width to expose a portion of the bond pad; and a conductive pillar having a first portion inside the pillar contact opening and a second portion disposed over the buffer layer, the second portion of the conductive pillar having a third width, wherein a ratio of the second width to the first width is between about 0.35 and about 0.65, and a second ratio of the second width to the third width is between about 0.35 and about 0.65.
地址 TW