发明名称 |
Thin-film transistor, method of manufacturing the same, and method of manufacturing backplane for flat panel display |
摘要 |
Provided are a thin-film transistor (TFT), a method of manufacturing the same, and a method of manufacturing a backplane for a flat panel display (FPD). The method of manufacturing the TFT according to an embodiment of the present invention includes forming a gate electrode on a substrate; forming an insulating layer on the substrate to cover the gate electrode; performing a plasma treatment on an upper surface of the insulating layer using a halogen gas; forming an oxide semiconductor layer on the insulating layer and positioned to correspond to the gate electrode; and forming source and drain electrodes on the insulating layer to contact and over portions of the oxide semiconductor layer. |
申请公布号 |
US9312395(B2) |
申请公布日期 |
2016.04.12 |
申请号 |
US201414339232 |
申请日期 |
2014.07.23 |
申请人 |
Samsung Display Co., Ltd.;University-Industry Cooperation Group of Kyung Hee University |
发明人 |
Seol Young-Gug;Kim Tae-Woong;Jang Jin;Avis Christophe |
分类号 |
H01L21/16;H01L29/786;H01L27/12;H01L29/66;H01L29/49 |
主分类号 |
H01L21/16 |
代理机构 |
Innovation Counsel LLP |
代理人 |
Innovation Counsel LLP |
主权项 |
1. A method of manufacturing a thin-film transistor (TFT), the method comprising:
forming a gate electrode on a substrate; forming an insulating layer on the substrate to cover the gate electrode; performing a plasma treatment on an upper surface of the insulating layer, the plasma treatment using a halogen gas; forming an oxide semiconductor layer on the insulating layer and positioned to correspond to the gate electrode; and forming source and drain electrodes on the insulating layer and over portions of the oxide semiconductor layer; wherein the forming an insulating layer comprises forming the insulating layer by a sol-gel process using a solution comprising hafnium chloride (HfCl4) dissolved in a solvent that includes at least one of acetonitrile and ethylene glycol. |
地址 |
KR |