发明名称 |
Magnetic field measuring apparatus and method for manufacturing same |
摘要 |
In order to provide a magnetic field measuring apparatus facilitating the pressure control in a gas cell, or capable of inspecting the internal pressure of the gas cell without using any special process, the magnetic field measuring apparatus is configured such that a process layer of the magnetic field measuring apparatus has such a structure that includes a first hollow portion and a second hollow portion provided opposed to first hollow portion with a first isolation wall interposed therebetween. Alternatively, a method for manufacturing the magnetic field measuring apparatus includes breaking the first isolation wall after generating alkali metal (FIG. 17 and FIG. 20). |
申请公布号 |
US9310447(B2) |
申请公布日期 |
2016.04.12 |
申请号 |
US201114358810 |
申请日期 |
2011.11.18 |
申请人 |
HITACHI, LTD. |
发明人 |
Kamada Yudai;Osabe Taro;Suzuki Seiichi;Kandori Akihiko;Kawabata Ryuzo |
分类号 |
G01R3/00;G01R33/032;G01R33/26 |
主分类号 |
G01R3/00 |
代理机构 |
Mattingly & Malur, P.C. |
代理人 |
Mattingly & Malur, P.C. |
主权项 |
1. A magnetic field measuring apparatus comprising:
a first sealing member; a second sealing member; and a process layer sealed by the first sealing member and the second sealing member, wherein the process layer includes a first hollow portion in which alkali metal gas is sealed, and a second hollow portion provided opposed to the first hollow portion with a first isolation wall interposed therebetween. |
地址 |
Tokyo JP |