发明名称 Magnetic field measuring apparatus and method for manufacturing same
摘要 In order to provide a magnetic field measuring apparatus facilitating the pressure control in a gas cell, or capable of inspecting the internal pressure of the gas cell without using any special process, the magnetic field measuring apparatus is configured such that a process layer of the magnetic field measuring apparatus has such a structure that includes a first hollow portion and a second hollow portion provided opposed to first hollow portion with a first isolation wall interposed therebetween. Alternatively, a method for manufacturing the magnetic field measuring apparatus includes breaking the first isolation wall after generating alkali metal (FIG. 17 and FIG. 20).
申请公布号 US9310447(B2) 申请公布日期 2016.04.12
申请号 US201114358810 申请日期 2011.11.18
申请人 HITACHI, LTD. 发明人 Kamada Yudai;Osabe Taro;Suzuki Seiichi;Kandori Akihiko;Kawabata Ryuzo
分类号 G01R3/00;G01R33/032;G01R33/26 主分类号 G01R3/00
代理机构 Mattingly & Malur, P.C. 代理人 Mattingly & Malur, P.C.
主权项 1. A magnetic field measuring apparatus comprising: a first sealing member; a second sealing member; and a process layer sealed by the first sealing member and the second sealing member, wherein the process layer includes a first hollow portion in which alkali metal gas is sealed, and a second hollow portion provided opposed to the first hollow portion with a first isolation wall interposed therebetween.
地址 Tokyo JP