发明名称 Bidirectional silicon carbide transient voltage supression devices
摘要 An electronic device includes a silicon carbide layer having a first conductivity type and having a first surface and a second surface opposite the first surface, and first and second silicon carbide Zener diodes on the silicon carbide layer. Each of the first and second silicon carbide Zener diodes may include a first heavily doped silicon carbide region having a second conductivity type opposite the first conductivity type on the silicon carbide layer, and an ohmic contact on the first heavily doped silicon carbide region.
申请公布号 US9312256(B2) 申请公布日期 2016.04.12
申请号 US201313860955 申请日期 2013.04.11
申请人 Cree, Inc. 发明人 Haney Sarah Kay;Ryu Sei-Hyung
分类号 H01L29/15;H01L27/02;H01L27/08;H01L29/16;H01L29/866 主分类号 H01L29/15
代理机构 Myers Bigel & Sibley, P.A. 代理人 Myers Bigel & Sibley, P.A.
主权项 1. An electronic device, comprising: a silicon carbide layer having a first conductivity type and having a first surface and a second surface opposite the first surface; first and second silicon carbide Zener diodes on the silicon carbide layer, wherein each of the first and second silicon carbide Zener diodes comprises a heavily doped silicon carbide epitaxial layer having a second conductivity type opposite the first conductivity type, wherein each of the heavily doped epitaxial layers forms a Zener junction with the silicon carbide layer and wherein the silicon carbide layer provides a common reference for the first and second silicon carbide Zener diodes, first and second ohmic contacts, respectively, on the heavily doped silicon carbide epitaxial layers of the first and second silicon carbide Zener diodes opposite the silicon carbide layer; and a third ohmic contact on the silicon carbide layer, the third ohmic contact providing a reference contact on the silicon carbide layer for both the first and second silicon carbide Zener devices.
地址 Durham NC US