发明名称 |
ELECTRONIC DEVICE, MANUFACTURING METHOD THEREOF, MANUFACTURING APPARATUS THEREOF |
摘要 |
Provided is an electronic device capable of preventing a deterioration in performance. A TFT (21) is provided with: a channel (14), an IGZO film constituting the channel (14); an etching stop film (22) adjacent to the corresponding channel (14); and a passivation film (23) facing the channel (14) across the etching stop film (22). The passivation film (23) is formed of a fluorine-containing silicon nitride film. A fluorine atom concentration at a boundary of the etching stop film (22) and the channel (14) is higher than a fluorine atom concentration at a part other than the boundary of the channel (14). A fluorine atom concentration distribution at a part other than the boundary of the etching stop film (22) has a concentration gradient declining toward the boundary. |
申请公布号 |
KR20160039542(A) |
申请公布日期 |
2016.04.11 |
申请号 |
KR20150135683 |
申请日期 |
2015.09.24 |
申请人 |
TOKYO ELECTRON LIMITED;KOCHI PREFECTURAL PUBLIC UNIVERSITY CORPORATION |
发明人 |
SATOYOSHI TSUTOMU;ISHIDA HIROSHI;SASAKI KAZUO;FURUTA MAMORU |
分类号 |
H01L29/786;H01L21/02;H01L27/32;H01L51/52 |
主分类号 |
H01L29/786 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|