发明名称 ELECTRONIC DEVICE, MANUFACTURING METHOD THEREOF, MANUFACTURING APPARATUS THEREOF
摘要 Provided is an electronic device capable of preventing a deterioration in performance. A TFT (21) is provided with: a channel (14), an IGZO film constituting the channel (14); an etching stop film (22) adjacent to the corresponding channel (14); and a passivation film (23) facing the channel (14) across the etching stop film (22). The passivation film (23) is formed of a fluorine-containing silicon nitride film. A fluorine atom concentration at a boundary of the etching stop film (22) and the channel (14) is higher than a fluorine atom concentration at a part other than the boundary of the channel (14). A fluorine atom concentration distribution at a part other than the boundary of the etching stop film (22) has a concentration gradient declining toward the boundary.
申请公布号 KR20160039542(A) 申请公布日期 2016.04.11
申请号 KR20150135683 申请日期 2015.09.24
申请人 TOKYO ELECTRON LIMITED;KOCHI PREFECTURAL PUBLIC UNIVERSITY CORPORATION 发明人 SATOYOSHI TSUTOMU;ISHIDA HIROSHI;SASAKI KAZUO;FURUTA MAMORU
分类号 H01L29/786;H01L21/02;H01L27/32;H01L51/52 主分类号 H01L29/786
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