发明名称 DETECTION CIRCUIT AND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device equipped with a detection circuit capable of preventing an erroneous detection result from being outputted even when a load-shorted detection circuit and a load-open detection circuit make misdetection due to fluctuations in a power supply voltage, etc.SOLUTION: The detection circuit comprises a load-shorted detection circuit for detecting that the load is shorted, a load-open detection circuit for detecting that the load is open, and a logic circuit for outputting the output signals of the load-shorted detection circuit and load-open detection circuit to an output terminal, the detection circuit being configured in such a way that, when the outputs of the load-shorted detection circuit and load-open detection circuit are of detection logic, the logic circuit outputs a signal of non-detection logic to the output terminal.SELECTED DRAWING: Figure 1
申请公布号 JP2016050893(A) 申请公布日期 2016.04.11
申请号 JP20140177504 申请日期 2014.09.01
申请人 SEIKO INSTRUMENTS INC 发明人 SUGIURA SHOICHI;IGARASHI ATSUSHI;OTSUKA NAOHIRO
分类号 G01R31/02;H03K17/00 主分类号 G01R31/02
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