发明名称 |
AUTOMATIC SAMPLE PIECE MANUFACTURING APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To provide an automatic sample piece manufacturing apparatus for automatizing an operation for extracting and transferring into a sample piece holder, a sample piece formed by processing of a sample by an ion beam.SOLUTION: An automatic sample piece manufacturing apparatus 10 includes a computer 21 for controlling a charged particle beam irradiation optical system 14, and sample piece transfer means so that a charged particle beam is irradiated to a deposition film adhering onto the sample piece transfer means after separating the sample piece transfer means from the sample piece.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016050854(A) |
申请公布日期 |
2016.04.11 |
申请号 |
JP20140176240 |
申请日期 |
2014.08.29 |
申请人 |
HITACHI HIGH-TECH SCIENCE CORP |
发明人 |
SATO MAKOTO;YAMAMOTO HIROSHI;TOMIMATSU SATOSHI;UEMOTO ATSUSHI |
分类号 |
G01N1/28;H01J37/20 |
主分类号 |
G01N1/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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