发明名称 AUTOMATIC SAMPLE PIECE MANUFACTURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide an automatic sample piece manufacturing apparatus for automatizing an operation for extracting and transferring into a sample piece holder, a sample piece formed by processing of a sample by an ion beam.SOLUTION: An automatic sample piece manufacturing apparatus 10 includes a computer 21 for controlling a charged particle beam irradiation optical system 14, and sample piece transfer means so that a charged particle beam is irradiated to a deposition film adhering onto the sample piece transfer means after separating the sample piece transfer means from the sample piece.SELECTED DRAWING: Figure 1
申请公布号 JP2016050854(A) 申请公布日期 2016.04.11
申请号 JP20140176240 申请日期 2014.08.29
申请人 HITACHI HIGH-TECH SCIENCE CORP 发明人 SATO MAKOTO;YAMAMOTO HIROSHI;TOMIMATSU SATOSHI;UEMOTO ATSUSHI
分类号 G01N1/28;H01J37/20 主分类号 G01N1/28
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