| 摘要 |
FIELD: chemistry.SUBSTANCE: invention can be used for non-contact and remote determination of thickness of flat dielectric materials. Invention comprises simultaneously emitting electromagnetic waves of a frequency Fand a frequency k times higher kFtowards surface of dielectric plate normal to it, receiving reflected wave, phase difference is calculated φbetween received wave with frequency kFand a wave with a frequency F, pre-multiplied by k, then simultaneously emitting electromagnetic waves with different frequency Fand a frequency k times higher kFtowards surface of dielectric plate normal to it, receiving reflected wave, phase difference is calculated φbetween received wave with frequency kFand a wave with a frequency F, pre-multiplied by k, thickness of dielectric plate is determined by phases φand φ.EFFECT: technical result is increasing accuracy of measurement.1 cl, 1 dwg |
