发明名称 SUBSTRATE PROCESSING DEVICE
摘要 A substrate processing device according to an embodiment of the present invention comprises: a removal part (D1) that removes liquid droplets which exist in a recess (30); a liquid discharge hole (30a) that is provided in a bottom part of the recess (30) of a nozzle head (32), and that discharges liquid droplets to be removed to the outside of the recess (30); and a control part (8) that controls an ejection state of a gas ejection nozzle (33) so that a period, in which a gas is ejected from the gas ejection nozzle (33) in a flow amount such that the gas does not reach a surface to be treated of a substrate W, exists during a period from completion of a rinse treatment by a treatment liquid on the surface to be treated until initiation of a drying treatment using a gas.
申请公布号 WO2016052642(A1) 申请公布日期 2016.04.07
申请号 WO2015JP77790 申请日期 2015.09.30
申请人 SHIBAURA MECHATRONICS CORPORATION 发明人 HAYASHI,KONOSUKE;OOTAGAKI,TAKASHI
分类号 H01L21/304;H01L21/677 主分类号 H01L21/304
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