IN-DIE TRANSISTOR CHARACTERIZATION IN AN IC

摘要

In an example implementation, an integrated circuit (IC) (102) includes: a plurality of transistors (122) disposed in a plurality of locations (120) on a die of the IC; conductors (124) coupled to terminals of each of the plurality of transistors; a digital-to-analog converter (DAC) (108), coupled to the conductors, to drive voltage signals to the plurality of transistors in response to a digital input; and an analog-to-digital converter (ADC) (110), coupled to at least a portion of the conductors, to generate samples in response to current signals induced in the plurality of transistors in response to the voltage signals, the samples being indicative of at least one electrostatic characteristic for the plurality of transistors.