发明名称 FIELD-EFFECT TRANSISTOR WITH OPTIMISED MIXED DRAIN CONTACT AND MANUFACTURING METHOD
摘要 The invention relates to a field-effect transistor comprising a substrate and a semi-conductor structure having a channel area, said transistor comprising a drain contact, a source contact and a gate, said source and drain contacts making it possible to generate a flow of charge carriers in the channel area, said flow being controlled by said gate, characterised in that: said drain contact is a mixed drain contact comprising at least one elementary ohmic continuous drain contact (CDoh) and an elementary Schottky drain contact (CDSch), said mixed drain contact being flush with said semiconductor structure; said elementary Schottky drain contact (CDSch) partially or completely overlapping said elementary ohmic drain contact (CDoh). The invention also relates to a method for manufacturing said transistor.
申请公布号 WO2016050879(A1) 申请公布日期 2016.04.07
申请号 WO2015EP72624 申请日期 2015.09.30
申请人 THALES 发明人 DELAGE, SYLVAIN;CARNEZ, BERNARD;AUBRY, RAPHAËL;JARDEL, OLIVIER;MICHEL, NICOLAS;OUALLI, MOURAD
分类号 H01L29/417;H01L29/66;H01L29/778;H01L29/78 主分类号 H01L29/417
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