发明名称 COMPOUND, RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN
摘要 PROBLEM TO BE SOLVED: To provide a resist composition from which a resist pattern with little defects and good line edge roughness can be produced.SOLUTION: The resist composition comprises a resin (A1) including a structural unit having an acid-labile group, a resin (A2) including a structural unit having a group represented by formula (Ia), and an acid generator. In formula (Ia), Rrepresents a fluorine atom or a 1-6C fluorinated alkyl group; ring W represents a 5-18C alicyclic hydrocarbon group; n represents an integer of 1 to 6 and when n is 2 or more, a plurality of Rmay be identical or different from each other; * represents a binding site; however, a carbon atom in the ring W is a secondary carbon or a tertiary carbon, and when the carbon atom is tertiary carbon, the group represented by formula (Ia) does not constitute an acid-labile group.SELECTED DRAWING: None
申请公布号 JP2016048372(A) 申请公布日期 2016.04.07
申请号 JP20150164503 申请日期 2015.08.24
申请人 SUMITOMO CHEMICAL CO LTD 发明人 MASUYAMA TATSURO;YAMAMOTO SATOSHI;ICHIKAWA KOJI
分类号 G03F7/038;C08F20/24;C08F20/56;G03F7/039;G03F7/20 主分类号 G03F7/038
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