| 发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR TESTING THE SAME |
| 摘要 |
A semiconductor device and a method for testing the same are provided. The semiconductor device includes a plurality of semiconductor dies staked, a plurality of through-electrodes disposed between the semiconductor dies, a first calculation unit calculating a first output value from input signals inputted into the through-electrodes by a logical operation, a second calculation unit calculating a second output value from output signals outputted from the through-electrodes by a logical operation, and a comparator comparing the first output value with the second output value. |
| 申请公布号 |
US2016097810(A1) |
申请公布日期 |
2016.04.07 |
| 申请号 |
US201414785042 |
申请日期 |
2014.02.25 |
| 申请人 |
INDUSTRY-ACA-DEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY |
发明人 |
KANG Sungho;PARK Jaeseok |
| 分类号 |
G01R31/3177;G01R31/28;G01R31/317;G01R31/26 |
主分类号 |
G01R31/3177 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A semiconductor device comprising:
a plurality of semiconductor dies staked; a plurality of through-electrodes disposed between the semiconductor dies; a first calculation unit calculating a first output value from input signals inputted into the through-electrodes by a logical operation; a second calculation unit calculating a second output value from output signals outputted from the through-electrodes by a logical operation; and a comparator comparing the first output value with the second output value. |
| 地址 |
Seoul KR |
