SEMICONDUCTOR DEVICE AND MULTI-SEMICONDUCTOR PACKAGE INCLUDING THE SAME

摘要

A semiconductor device includes a built-in self-test controller suitable for generating a test command and test data, and generating a test result signal in response to test result data, in a built-in self-test mode, an internal circuit suitable for performing a test operation in response to the test command and the test data and generating the test result data as a result of the test operation, and a signal transfer controller suitable for outputting the test command, the test data, and the test result signal through a set probe pad and a set bump pad in the built-in self-test mode.

主权项

1. A semiconductor device, comprising:
a built-in self-test controller suitable for generating a test command and test data, and generating a test result signal in response to test result data, in a built-in self-test mode; an internal circuit suitable for performing a test operation in response to the test command and the test data and generating the test result data as a result of the test operation; and a signal transfer controller suitable for outputting the test command, the test data, and the test result signal through a set probe pad and a set bump pad in the built-in self-test mode.